Characterization of TiAl Alloys by Secondary Ion Mass Spectrometry

Joaquim Barbosa; Orlando M.N.D. Teodoro; Augusto M.C. Moutinho; Sidney José Lima Ribeiro; Caetano Monteiro

doi:10.4028/www.scientific.net/MSF.455-456.653

Paper Titles

Contribution of the Phase-Matrix Interface to the Behaviour of Aluminium Filled Epoxies
p.635

Interfacial Reactions, Thermodynamics and Kinetics in Doped Aluminosilicate Ceramics/Liquid Al-Alloy Contacting Systems
p.639

Tensile Testing and Dislocation Glide in Liquid Foams
p.644

Effects of Triple Grain Junctions on Equilibrium Boundary Angles and Grain Growth Kinetics
p.648

Characterization of TiAl Alloys by Secondary Ion Mass Spectrometry
p.653

Ellipsometry to Access Structural Information of Electroactive Polymer Films
p.657

Effect of Substrate Preparation Conditions on the Morphology of Polypyrrole Coatings on Copper - an AFM Study
p.661

Spectral Imaging for Visualization of Distribution of Nd³⁺ Ions in CaTaO₆ Fibre
p.665

Minimum Surface Energy of Self-Assembled Two-Dimensional Cells of Equal Area
p.671

HomeMaterials Science ForumMaterials Science Forum Vols. 455-456Characterization of TiAl Alloys by Secondary Ion...

Characterization of TiAl Alloys by Secondary Ion Mass Spectrometry

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Materials Science Forum (Volumes 455-456)

Pages:

653-656

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.455-456.653

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Online since:

May 2004

Authors:

Joaquim Barbosa, Orlando M.N.D. Teodoro, Augusto M.C. Moutinho, Sidney José Lima Ribeiro, Caetano Monteiro

Keywords:

Induction Melting, Investment Casting, SIMS, Surface/Interface Analysis, TiAl

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