Luminescence-Based Characterization of Protective Oxides: from Failure Mechanisms to Non-Destructive Evaluation

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Periodical:

Materials Science Forum (Volumes 461-464)

Edited by:

Pierre Steinmetz, Ian G. Wright, Gerry Meier, Alain Galerie, Bernard Pieraggi and Renaud Podor

Pages:

621-630

DOI:

10.4028/www.scientific.net/MSF.461-464.621

Citation:

D. R. Clarke et al., "Luminescence-Based Characterization of Protective Oxides: from Failure Mechanisms to Non-Destructive Evaluation", Materials Science Forum, Vols. 461-464, pp. 621-630, 2004

Online since:

August 2004

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$35.00

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