A Simple Method of the Electric/Magnetic Field Observation by a Conventional Transmission Electron Microscope

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Abstract:

A novel method to observe the electrostatic field distribution with a conventional transmission electron microscope has been developed. The method allows measurements of a potential difference less than 1V/µm. This method can be performed in any kind of conventional transmission electron microscope and applied to the observation of the electric/magnetic field at the level of a specimen.

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Periodical:

Materials Science Forum (Volumes 475-479)

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4029-4034

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January 2005

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© 2005 Trans Tech Publications Ltd. All Rights Reserved

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