A Simple Method of the Electric/Magnetic Field Observation by a Conventional Transmission Electron Microscope

Abstract:

Article Preview

A novel method to observe the electrostatic field distribution with a conventional transmission electron microscope has been developed. The method allows measurements of a potential difference less than 1V/µm. This method can be performed in any kind of conventional transmission electron microscope and applied to the observation of the electric/magnetic field at the level of a specimen.

Info:

Periodical:

Materials Science Forum (Volumes 475-479)

Main Theme:

Edited by:

Z.Y. Zhong, H. Saka, T.H. Kim, E.A. Holm, Y.F. Han and X.S. Xie

Pages:

4029-4034

DOI:

10.4028/www.scientific.net/MSF.475-479.4029

Citation:

K. Sasaki and H. Saka, "A Simple Method of the Electric/Magnetic Field Observation by a Conventional Transmission Electron Microscope", Materials Science Forum, Vols. 475-479, pp. 4029-4034, 2005

Online since:

January 2005

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Price:

$35.00

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