A Simple Method of the Electric/Magnetic Field Observation by a Conventional Transmission Electron Microscope
A novel method to observe the electrostatic field distribution with a conventional transmission electron microscope has been developed. The method allows measurements of a potential difference less than 1V/µm. This method can be performed in any kind of conventional transmission electron microscope and applied to the observation of the electric/magnetic field at the level of a specimen.
Z.Y. Zhong, H. Saka, T.H. Kim, E.A. Holm, Y.F. Han and X.S. Xie
K. Sasaki and H. Saka, "A Simple Method of the Electric/Magnetic Field Observation by a Conventional Transmission Electron Microscope", Materials Science Forum, Vols. 475-479, pp. 4029-4034, 2005