Texture Determination of Thin Cu-Wires by Synchrotron Radiation

Heinz Günter Brokmeier; Brigitte Weiss; Sang Bong Yi; Wenhai Ye Yi; Klaus Dieter Liss; Thomas Lippmann

doi:10.4028/www.scientific.net/MSF.495-497.131

Paper Titles

Quantitative Texture Measurements Using Neutron Time-Of-Flight Diffraction
p.107

Quantitative Texture Analysis with the HIPPO TOF Diffractometer
p.113

Effect of Strong Neutron Absorption on Texture and Diffraction Data Analysis
p.119

In Situ High Temperature Texture Characterisation in NiTi Shape Memory Alloy Using Synchrotron Radiation
p.125

Texture Determination of Thin Cu-Wires by Synchrotron Radiation
p.131

Measurement of High-Resolution Recrystallization Textures in Nickel Sheets Using High-Energy Synchrotron Radiation
p.137

Determination of Multipeak Textures with High-Energy Synchrotron Radiation
p.143

Quantification of Texture Inhomogeneity
p.149

The Use of Rodrigues-Frank Space for Representing Discrete Misorientation Distributions
p.157

HomeMaterials Science ForumMaterials Science Forum Vols. 495-497Texture Determination of Thin Cu-Wires by...

Texture Determination of Thin Cu-Wires by Synchrotron Radiation

Abstract:

A new method to investigate thin wires has been tested, which is based on a special sample holder and on a high energy X-rays. Due to the high penetration power of high energy Xrays quantitative texture data will be obtained without any additional corrections such as constant volume correction and absorption correction. The measurements have been carried out at the high energy beam line BW5 at HASYLAB – DESY (Hamburg). In order to overcome grain statistics problems on the investigated Cu-wire of 122µm thickness a special scanning routine together with the sample preparation allows to average over a wire length between 1mm and up to 240 mm.