Measurement of High-Resolution Recrystallization Textures in Nickel Sheets Using High-Energy Synchrotron Radiation

Helmut Klein; Andrea Preusser; Lars Raue; Hans Joachim Bunge

doi:10.4028/www.scientific.net/MSF.495-497.137

Paper Titles

Quantitative Texture Analysis with the HIPPO TOF Diffractometer
p.113

Effect of Strong Neutron Absorption on Texture and Diffraction Data Analysis
p.119

In Situ High Temperature Texture Characterisation in NiTi Shape Memory Alloy Using Synchrotron Radiation
p.125

Texture Determination of Thin Cu-Wires by Synchrotron Radiation
p.131

Measurement of High-Resolution Recrystallization Textures in Nickel Sheets Using High-Energy Synchrotron Radiation
p.137

Determination of Multipeak Textures with High-Energy Synchrotron Radiation
p.143

Quantification of Texture Inhomogeneity
p.149

The Use of Rodrigues-Frank Space for Representing Discrete Misorientation Distributions
p.157

Effect of Local Texture on the Orange Peel Defect in St14 Steel Sheet
p.167

HomeMaterials Science ForumMaterials Science Forum Vols. 495-497Measurement of High-Resolution Recrystallization...

Measurement of High-Resolution Recrystallization Textures in Nickel Sheets Using High-Energy Synchrotron Radiation

Abstract:

The new developed “sweeping detector” techniques using high energy synchrotron radiation allow to measure textures and microstructures of materials and their change during heat treatment with high location and orientation resolution. Here we show these new methods applied to cold rolled and subsequently annealed nickel samples. The grain-resolved measurements show, impressively, many details of the recrystallization process which can otherwise not be seen. The results of these measurements can be the base for omprehensive recrystallization theories.