Measurement of High-Resolution Recrystallization Textures in Nickel Sheets Using High-Energy Synchrotron Radiation

Abstract:

Article Preview

The new developed “sweeping detector” techniques using high energy synchrotron radiation allow to measure textures and microstructures of materials and their change during heat treatment with high location and orientation resolution. Here we show these new methods applied to cold rolled and subsequently annealed nickel samples. The grain-resolved measurements show, impressively, many details of the recrystallization process which can otherwise not be seen. The results of these measurements can be the base for omprehensive recrystallization theories.

Info:

Periodical:

Materials Science Forum (Volumes 495-497)

Edited by:

Paul Van Houtte and Leo Kestens

Pages:

137-142

DOI:

10.4028/www.scientific.net/MSF.495-497.137

Citation:

H. Klein et al., "Measurement of High-Resolution Recrystallization Textures in Nickel Sheets Using High-Energy Synchrotron Radiation ", Materials Science Forum, Vols. 495-497, pp. 137-142, 2005

Online since:

September 2005

Export:

Price:

$35.00

In order to see related information, you need to Login.