The Influence of Errors of X-Ray Texture Measurements on ODF Calculation with Central Normal Distribution Approximation

T.M. Ivanova; H.U. Lubman; T.I. Savyolova; Vladimir Serebryany

doi:10.4028/www.scientific.net/MSF.495-497.273

Paper Titles

High Resolution Texture Analysis with Spherical Wavelets
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Combined Synchrotron and Neutron Strcutural Refinement of R-Phase in Ti_50.75.Ni_47.75.Fe_1.50 Shape Memory Alloy
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On Probability - Statistical Representation of Pole Figures for Materials with Hexagonal Symmetry
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Determination of an ODF from Diffraction Measurements Based on Optimal Smoothing Splines
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The Influence of Errors of X-Ray Texture Measurements on ODF Calculation with Central Normal Distribution Approximation
p.273

Common Basics of Mathematical Texture Analysis
p.277

Geometry of the ODF-to-PDF Projection in Quaternion Representation
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Visualization of Patterns of Preferred Crystallographic Orientation by ω-Sections
p.289

Ideal Patterns of Crystallographic Preferred Orientation and Their Representation by the von Mises - Fisher Matrix or Bingham Quaternion Distribution
p.295

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The Influence of Errors of X-Ray Texture Measurements on ODF Calculation with Central Normal Distribution Approximation

Abstract:

Experimental pole figures are measured by x-ray method for materials with hexagonal symmetry (Ti and Mg alloys). The Orientation Distribution Function is calculated by approximation method with central normal distribution. Texture inhomogeneities and effects of defocusing are the main sources of pole density errors. The measurement errors depend on crystal direction {hkl} and are different for maximum and minimum regions on pole figure. The influence of texture measurement errors on accuracy of the ODF calculation is investigated.