Nano-Scale Stress Microscopy of Ceramic Materials Using Their Cathodoluminescence Emission

Abstract:

An overview is given of our recent research achievements in nano-scale stress microscopy based on cathodoluminescence (CL) piezo-spectroscopy (PS) studies of ceramics. The main underlying concepts of CL nano-scale microscopy are presented, with emphasis placed on the spatial resolution of the electron probe operating at low voltages in a field-emission gun scanning electron microscope (FEG-SEM). The stress assessment technique shown here proves its general validity independent of the physical mechanisms behind the CL emission. A table, including CL spectra from impurities, defects and electron-hole recombination, is given of the stress dependence of the wavelength of selected CL bands from various ceramics of industrial use, including a reliability assessment of these dependences. Finally, some applications of nano-scale stress microscopy are shown and brief comments are offered regarding possible future evolutions and impacts on the development of new materials and devices.

• Periodical: Materials Science Forum (Volume 502)
• Pages: 263-268
• DOI: https://doi.org/10.4028/www.scientific.net/MSF.502.263
• Online since: December 2005
• Authors: Giuseppe Pezzotti
• Keywords: Cathodoluminescence, Ceramic, Nano-Scale Stress Microscopy

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