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Fundamental Measurements of the Friction on an Atomically-Flat Terrace of Au(100) in Sulfuric Acid Solution under Potential Control Using Electrochemical Atomic Force Microscope

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Abstract:

Potential dependence of the friction force between an atomically-flat terrace of Au(100) single crystal and a tip attached to a silicon nitride cantilever of electrochemical atomic force microscope (EC-AFM) have been investigated qualitatively in 0.05 M H2SO4 aqueous solution. It is found that the friction force gains when the potential increases in the potential range between −400 mV and 400 mV vs Hg/Hg2SO4 electrode.

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Periodical:

Materials Science Forum (Volume 512)

Pages:

395-398

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.512.395

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Online since:

April 2006

Authors:

Nobumitsu Hirai, Tatsuya Tooyama, Toshihiro Tanaka

Keywords:

Electrochemical Atomic Force Microscope, Friction, Gold Single Crystal, Lateral Force Microscope, Metal/Electrolyte Interface

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© 2006 Trans Tech Publications Ltd. All Rights Reserved

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