Studies of the Dynamics of Thin Ion Exchange Films by Spectroscopic Ellipsometry and Attenuated Total Reflectance Spectroscopy

N. Pantelić; A. Piruska; Carl J. Seliskar

doi:10.4028/www.scientific.net/MSF.518.431

Paper Titles

Chemical Oxidative Polymerization of 4-Amino-3-Hydroxynaphthalene-1-Sulfonic Acid and Its Salts
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Molecular Modeling of New Dioxomolybdenum(VI) Complexes with Heteroalicyclic Dithiocarbamates. In Silico Models for Metal–Implant Coating within Living Systems
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Modification of Dynamic Properties of SBR Rubber Composites with Silica Fillers
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Spectroscopic Ellipsometry as a Tool for On-Line Monitoring and Control of Surface Treatment Processes
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Studies of the Dynamics of Thin Ion Exchange Films by Spectroscopic Ellipsometry and Attenuated Total Reflectance Spectroscopy
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Broadband Dielectric Spectroscopy of Inorganic Solids
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Optical Study of Eu³⁺ Ion Embedded in (1-x)Na₂WO₄-xP₂O₅ Glasses Highlighting a Temperature Effect on its Local Environment
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Synthesis, Structural and Luminescent Properties of Gd₂O₃-SiO₂:Eu³⁺ Nanopowder Composites
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Raman Spectroscopy of Hg_1-xMn_xSe Alloys: Part II
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Studies of the Dynamics of Thin Ion Exchange Films by Spectroscopic Ellipsometry and Attenuated Total Reflectance Spectroscopy

Abstract:

A chemically selective film, usually of optical quality, is a key component of optical and electrochemical sensors. We have examined the dynamics of various thin selective films by spectroscopic ellipsometry and attenuated total reflectance (ATR) spectroscopy. Spectroscopic ellipsometry provided a non-invasive method for measurement of optical constants (n(λ), refractive index; k(λ), extinction coefficient) and thicknesses of thin selective films which were conditioned in time by solvent and penetrant mass transport. The methods we have developed allowed us to characterize film dynamic response, stability, and chemically specific mass transport even to the point of quantitatively modeling both transport and structural changes. The ATR spectra of thin, highly absorbing films are distorted both by reflectance and interference phenomena. Enhanced absorbance was observed under film leaky mode conditions.