Void Formation in Growing Oxide Scales with Schottky Defects and P-Type Conduction

Toshio Maruyama; Kojiro Akiba; Mitsutoshi Ueda; Kenichi Kawamura

doi:10.4028/www.scientific.net/MSF.595-598.1039

Paper Titles

The Influence of H₂O on Iron Oxidation at 600°C: A Microstructural Study
p.1005

The Effect of Additional Elements on Oxide Scale Evolution of Fe-20at.%Cr-10at.%Al Alloy at 900 °C in Air
p.1013

On the Mutual Interaction between Mechanical Stresses and Internal Corrosion during Isothermal and Cyclic Oxidation of Nickel-Base Superalloys
p.1023

Thermal Effects of Continuous Laser Treatment on Ti-6 Al(wt%)-4V(wt%) Titanium Alloy
p.1033

Void Formation in Growing Oxide Scales with Schottky Defects and P-Type Conduction
p.1039

Oxidation and Nitridation of Pure Chromium at Elevated Temperature in Synthetic Air – Effect of Silicon Addition
p.1047

The Effect of Copper and Ceria Additions on the High Temperature Oxidation of Nickel
p.1057

Oxidation Performance of High Temperature Mo-Si-B Alloys and Coatings
p.1065

The Effect of CaO Coatings on the Oxidation Behaviour of Polycrystalline Nickel between 800 and 1200 °C
p.1075

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Void Formation in Growing Oxide Scales with Schottky Defects and P-Type Conduction

Abstract:

A quantitative elucidation of the void formation in a growing scale with Schottky defects and p-type conduction during high temperature oxidation of metals. The evaluation of the divergence of ionic fluxes indicates that (1) Voids form in the scale preferentially in the vicinity of the metal/scale interface, (2) The volume of voids increases in a parabolic manner, (3) The volume fraction of voids and the scale is independent of time. The comparison between the calculation and the experimentally observed scale microstructure of NiO and CoO confirmed well the validity of the prediction.