Photoelectrochemical Characterisation of Chromia Scales Thermally Grown on Various Metal Substrates
Chromia scales grown on several chromia-forming metallic substrates in various conditions were characterised by photoelectrochemistry (PEC), highlighting the presence of two semiconductor phases signed by their respective bandgaps (3.0 and 3.5 eV) with variations of semiconduction type (n, p and insulator, more or less doped). The protective character of the scale was clearly demonstrated when the highest bandgap phase (3.5 eV), identified as the external subscale was close to an insulator.
Pierre Steinmetz, Ian G. Wright, Alain Galerie, Daniel Monceau and Stéphane Mathieu
Y. Wouters et al., "Photoelectrochemical Characterisation of Chromia Scales Thermally Grown on Various Metal Substrates", Materials Science Forum, Vols. 595-598, pp. 1181-1188, 2008