High Resolution MicroRaman Study of Blisters in Cr2O3 Thermal Oxide Films

Mbaihoudou Kemdehoundja; Jean Luc Grosseau-Poussard; J.F. Dinhut; G. Bonnet

doi:10.4028/www.scientific.net/MSF.595-598.889

Paper Titles

Effects of Microstructural Arrangement on Hot Corrosion Resistance of a Pb-Sb Alloy for Battery Grids
p.851

Influence of Tantalum on the Rates of High Temperature Oxidation and Chromia Volatilization for Cast (Fe and/or Ni)-30Cr-0.4C Alloys
p.861

Study of the Behavior in Oxidation at High Temperature of Ni, Co and Fe-Base Alloys Containing Very High Fractions of Carbides
p.871

Microstructure Influence on Residual Stresses in Growing Chromia Oxide Films as Determined by In Situ High Temperature Raman Spectroscopy
p.881

High Resolution MicroRaman Study of Blisters in Cr₂O₃ Thermal Oxide Films
p.889

Yttrium Implantation and Manganese Addition Element Effects on the High Temperature Oxidation Resistance of a Model Steel
p.897

Comments on the Quantification of Mechanical Adhesion Energy of Thermal Oxide Scale on Metallic Substrate Using Tensile Test
p.907

Thermal Alumina Scales on FeCrAl: Characterization and Growth Mechanism
p.915

Relation between Synthesis Process, Microstructure and Corrosion Resistance of Two Yttrium Silicates
p.923

HomeMaterials Science ForumMaterials Science Forum Vols. 595-598High Resolution MicroRaman Study of Blisters in...

High Resolution MicroRaman Study of Blisters in Cr₂O₃ Thermal Oxide Films

Abstract:

Using Raman microprobe spectroscopy made it possible to study the buckling phenomenon in chromia films grown at 900°C in air from a Ni30at%Cr alloy. Blisters have been optically observed to be circular and, from the top view, the mean radius has been measured with an accuracy of about 1%m. An autofocus device allows the characterisation of the profile of each blister and the shift of the A1g Raman peak of chromia gave the local stress far from the blister and all along the buckled zone. From these observations, the induced spalling has been related to the blister morphology.