High Resolution MicroRaman Study of Blisters in Cr2O3 Thermal Oxide Films

Abstract:

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Using Raman microprobe spectroscopy made it possible to study the buckling phenomenon in chromia films grown at 900°C in air from a Ni30at%Cr alloy. Blisters have been optically observed to be circular and, from the top view, the mean radius has been measured with an accuracy of about 1%m. An autofocus device allows the characterisation of the profile of each blister and the shift of the A1g Raman peak of chromia gave the local stress far from the blister and all along the buckled zone. From these observations, the induced spalling has been related to the blister morphology.

Info:

Periodical:

Materials Science Forum (Volumes 595-598)

Edited by:

Pierre Steinmetz, Ian G. Wright, Alain Galerie, Daniel Monceau and Stéphane Mathieu

Pages:

889-896

DOI:

10.4028/www.scientific.net/MSF.595-598.889

Citation:

M. Kemdehoundja et al., "High Resolution MicroRaman Study of Blisters in Cr2O3 Thermal Oxide Films", Materials Science Forum, Vols. 595-598, pp. 889-896, 2008

Online since:

September 2008

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$35.00

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