Electron Tomography of Nanostructured Materials – Towards a Quantitative 3D Analysis with Nanometer Resolution

Abstract:

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Electron tomography has developed into a powerful technique to image the 3D structure of complex materials with nanometer resolution. Both, TEM and HAADF-STEM tomography exhibit tremendous possibilities to visualize nanostructured materials for a wide range of applications. Electron tomography is not only a qualitative tool to visualize nano¬structures, but recently electron tomographic results are also exploited to obtain quantitative measurements in 3D. We evaluated the reconstruction and segmentation process for a heterogeneous catalyst and, in particular, tried to assess the reliability and accuracy of the quantification process. Furthermore, a quantitative analysis of electron tomographic results was compared to macroscopic measurements.

Info:

Periodical:

Materials Science Forum (Volumes 638-642)

Main Theme:

Edited by:

T. Chandra, N. Wanderka, W. Reimers , M. Ionescu

Pages:

2517-2522

DOI:

10.4028/www.scientific.net/MSF.638-642.2517

Citation:

C. Kübel et al., "Electron Tomography of Nanostructured Materials – Towards a Quantitative 3D Analysis with Nanometer Resolution", Materials Science Forum, Vols. 638-642, pp. 2517-2522, 2010

Online since:

January 2010

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$35.00

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