Arturo Ponce and Darío Bueno
Abstract: A focused ion beam (FIB) mill equipped with a microsampling (MS) unit and combined with transmission electron microscopy (TEM)/scanning...
Abstract: The preparation of thin lamellas by focused ion beam (FIB) for MEMS-based in situ TEM experiments is time consuming. Typically, the lamellas...
This paper has been added to your cart ($35.00)
You may also Subscribe for unlimited downloads of all papers and abstracts on www.scientific.net ($135.00 per month)
Scientific.Net is a registered brand of Trans Tech Publications Inc
© 2017 by Trans Tech Publications Inc. All Rights Reserved