New Signal Processing Method for Electromagnetic Inspection Using Multidirectional Magnetizing Type Sensor

Toshiyuki Suzuma

doi:10.4028/www.scientific.net/MSF.670.137

Paper Titles

Numerical Analysis of the Polishing Process of Inner Tube Wall Using Micron-Size Particles in Magnetic Fluids
p.110

Nanostructure Formation in Silicon Photovoltaic Cells by Femtosecond Laser Pulses
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Measurements of Magnetic Properties of Fe-Mn-Cr-Si-Sm-B Ferromagnetic Shape Memory Ribbons Depending on Stress and Temperature
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Oblique Ion Etching for Copper at Elevated Temperature
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New Signal Processing Method for Electromagnetic Inspection Using Multidirectional Magnetizing Type Sensor
p.137

Inductive Proximity Sensor with Novel Structure of Ferrite Core
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Non-Destructive Evaluation for Internal Defect of Metal Casting
p.151

Adaptive Scanning Algorithm Based on Neural Network Prediction of Eddy Current Testing Signals
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A Magnetic Microsensor with Temperature Compensation Based on Optical Mechatronic Technology
p.164

HomeMaterials Science ForumMaterials Science Forum Vol. 670New Signal Processing Method for Electromagnetic...

New Signal Processing Method for Electromagnetic Inspection Using Multidirectional Magnetizing Type Sensor

Abstract:

New signal processing method for Electromagnetic Inspection using multidirectional magnetizing type sensor has been developed to detect linear-shaped defects such as cracks in every direction in test objects. In this method, the Amplitude-Modulated alternating currents, whose waveforms are the product of two sinusoidal waves of different frequencies, are used to produce a rotating magnetic field in test objects. The signal caused by a lift off variation of the sensor, which is not avoidable by conventional multidirectional magnetizing method, is reduced by this method. The effect is investigated by a test using 0.25% carbon steel sheet. It is also investigated that the inclined angles of defects are obtained by the phase information of the signal in a phasor diagram.

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Periodical:

Materials Science Forum (Volume 670)

Pages:

137-141

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.670.137

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Online since:

December 2010

Authors:

Toshiyuki Suzuma

Keywords:

Crack, Nondestructive Testing (NDT), Sensor, Signal Processing

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References

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