In Situ Stress Measurement Method Based on X-Ray Diffraction under Biaxial Tensile Loading

Abstract:

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The purpose of this investigation is to detect damage from stress distribution in the surface of near pre-crack tip by using X-ray diffraction technique during biaxial tension test. An measurements apparatus to measure stress distribution along pre-crack direction was fabrication by use of a biaxial tensile test device and a stress analyzer based on single exposure technique with one position sensitive proportional counter. Stress distribution with different tensile applied stress ratios were measured during biaxial tension test. As results, the shape of actual stress was keeping increase with increasing tensile applied stress. At maximum applied stress, the residual stress increases with the increasing distance from the crack tip; after reaching a maximum it gradually diminish.

Info:

Periodical:

Materials Science Forum (Volumes 675-677)

Edited by:

Yi Tan and Dongying Ju

Pages:

615-618

DOI:

10.4028/www.scientific.net/MSF.675-677.615

Citation:

D. Y. Ju et al., "In Situ Stress Measurement Method Based on X-Ray Diffraction under Biaxial Tensile Loading", Materials Science Forum, Vols. 675-677, pp. 615-618, 2011

Online since:

February 2011

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Price:

$35.00

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