Structural and Optical Properties of Zn1-XCrXO Thin Films Deposited by Magnetron Sputtering

Chang Feng Fu; Lian Fu Han; Chao Liu; Xi Ming Chen

doi:10.4028/www.scientific.net/MSF.687.750

Paper Titles

Preparation and Electrochemical Properties of NiO Thin Films by Sol-Gel
p.729

Preparation and Properties of Water-Based Solar-Reflective Coatings with Color Hollow Ceramic Microsphere
p.734

DLC Films Synthesized on the Ti6Al4V Alloy Surface by Plasma Gun at an Atmospheric Pressure
p.739

Study on W-Mo-Y Multi-Elements Alloying and Plasma Nitriding on Q235 Steel
p.745

Structural and Optical Properties of Zn_1-XCr_XO Thin Films Deposited by Magnetron Sputtering
p.750

Structure and Magnetic Properties of CoFe₂O₄ Nanocrystal Thin Films Prepared by Sol-Gel Method
p.756

Study on Tribological Performance of the TiNi Modified Layer on the Surface of the Ti6Al4V Alloy
p.759

Synthesis of Porous TiO₂ Thin Films via Sol-Gel Method and their Phototocatalyst Performances
p.765

The Microstructure, Resistivity and Infrared Emissivity of ITO Film with O/Ar Ratio Variation in Al₂O₃ Buffer Layer
p.771

HomeMaterials Science ForumMaterials Science Forum Vol. 687Structural and Optical Properties of Zn1-XCrXO...

Structural and Optical Properties of Zn_1-XCr_XO Thin Films Deposited by Magnetron Sputtering

Abstract:

In this study, Zn_1-xCr_xO thin films were successfully fabricated on glass substrates by magnetron sputtering technique. The relationship between Cr doping concentration and the structural and optical characteristics of the produced samples was investigated by X-ray diffraction (XRD), optical transmittance and photoluminescence(PL). EDS results demonstrate that Cr ions are substitutionally incorporated into ZnO. XRD analysis reveals that all the prepared films with a preferential c-axis orientation exhibit the wurtzite structure of ZnO. The spectrometer transmittance data indicates that the band gap energies of the Zn_1-xCr_xO films are calculated by a linear fitting method. The band gap is found to be large with the increasing dopant concentration. The PL spectra suggest that all the samples have an ultraviolet emission peak centered at 370 nm. With the improved Cr-doped concentration, the peaks of ultraviolet emission have a blue shift to the region of higher photon energy, which is coincident with those values calculated by the linear fitting from the transmittance data. It is also found that the intensity of ultraviolet emission has been remarkably improved when Cr content is approximately 2.0at.%, but it is decreased when doping concentration of Cr is excessively high.

You might also be interested in these eBooks

Functional and Electronic Materials, IUMRS-ICA2010

View Preview

Info:

Periodical:

Materials Science Forum (Volume 687)

Pages:

750-755

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.687.750

Citation:

Cite this paper

Online since:

June 2011

Authors:

Chang Feng Fu, Lian Fu Han, Chao Liu, Xi Ming Chen

Keywords:

Blue Shift, Magnetron Sputtering, Photoluminescence (PL), Zn_1-XCr_xO Thin Film

Export:

RIS, BibTeX

Price:

Permissions CCC:

Request Permissions

Permissions PLS:

Request Permissions

Сopyright:

Citation:

References

[1] M.F. Jiang, Z. N. Wang, Z. Y. Ning: Thin Solid Films Vol. 517-24 (2009), p.6717.

Google Scholar

[2] C.F. Fu, X.M. Chen, W. Li: J. Tianjin University of Technology Vol. 25-5 (2009), p.15.

Google Scholar

[3] L.P. Zhu, J.S. Li, Z.Z. Ye, H.P. He, X.J. Chen, B.H. Zhao: Opt. Mater. Vol. 31-2 (2008), p.237.

Google Scholar

[4] H. Xue, X.L. Xu, Y. Chen, G.H. Zhang, G.H. Ma: Appl. Surf. Sci. Vol. 255-5 (2008), p.1806.

Google Scholar

[5] M.H. Choi, T.Y. Ma: Mater. Lett. Vol. 62-12 (2008), p.1835.

Google Scholar

[6] Y. Kalyana, K. Srinivas, B. Sreedhar, M.M. Raja, M. Vithal, P.V. Reddy: Appl. Surf. Sci. Vol. 252-4 (2005), p.939.

Google Scholar

[7] I. Lorite, F. Rubio-Marcos, J.J. Romero, J.F. Fernandez: Mater. Lett. Vol. 63-2 (2009), p.212.

Google Scholar

[8] W.J. Zheng, M. Murakami, T. Fukumura: J. Cryst. Growth Vol. 214-215 (2000), p.55.

Google Scholar