Determination of the Epitaxial Strains of a Thermally Grown Oxide on a Metallic Substrate

Abstract:

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A generalization of the Bollmann’s method is used to evaluate the epitaxial strains at the metal/oxide interface. The numerical approach is described and applied to the Ni/NiO system in order to study the result sensitivity to some numerical parameters.

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Periodical:

Edited by:

Toshio Maruyama, Masayuki Yoshiba, Kazuya Kurokawa, Yuuzou Kawahara and Nobuo Otsuka

Pages:

176-182

DOI:

10.4028/www.scientific.net/MSF.696.176

Citation:

L. Kurpaska et al., "Determination of the Epitaxial Strains of a Thermally Grown Oxide on a Metallic Substrate", Materials Science Forum, Vol. 696, pp. 176-182, 2011

Online since:

September 2011

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$35.00

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