Determination of Crystallographic Elements (Dislocation and Surface Plane) from Automated TEM Orientation Determination

Yu Dong Zhang; Shi Ying Wang; Claude Esling; Xiang Zhao; Liang Zuo

doi:10.4028/www.scientific.net/MSF.702-703.866

Paper Titles

Variant Selection and Texture in an AISI 301LN Stainless Steel
p.850

In Situ Observation on the Influence of ß Grain Growth on Texture Evolution during Phase Transformation in Ti-6A-4V
p.854

Nanocrystallization and Texture Transformation in the Surface Layer of Copper Induced by Surface Mechanical Attrition
p.858

Determination of the Orientation Relation from Variants Inherited by Phase Transformation
p.862

Determination of Crystallographic Elements (Dislocation and Surface Plane) from Automated TEM Orientation Determination
p.866

Evolution of Hot Rolling and Phase Transformation Textures in an α″ (Orthorhombic) Phase in Ti-Nb Alloys
p.872

Evolution of Texture during Directional Solidification of Giant Magnetostrictive Tb_0.3Dy_0.7Fe_1.95 Alloy
p.876

Restitution of Prior-Austenite Grain Orientation by Microtexture Analysis of Tempered Martensite Structure in 9Cr-1Mo Ferritic Steel
p.880

Textural Evolution Evaluated by EBSD and XRD after Thermal Treatment in Ni-Ti Shape Memory Alloy
p.884

HomeMaterials Science ForumMaterials Science Forum Vols. 702-703Determination of Crystallographic Elements...

Determination of Crystallographic Elements (Dislocation and Surface Plane) from Automated TEM Orientation Determination

Abstract:

Abstract In the present work, we summarized two calculation methods to determine some specific crystallographic elements based on electron diffraction orientation measurements performed by TEM. The first one is to determine the type and the Burgers vector of dislocations for a known crystal structure. The method calculates the orientation of the projections of all the possible dislocation line vectors in the TEM screen coordinate system using the determined crystallographic orientation of the grain and then compares them with the observed ones to identify the observed dislocations. The second is to characterize the surface crystalline planes and directions of faceted nano-particles. With the determination of the edge trace vectors and then the plane normal vectors in the screen coordinate system of the TEM, their Miller indices in the crystal coordinate system can be calculated through coordinate transformation. These methods are expected to facilitate the related studies.

You might also be interested in these eBooks

View Preview

Info:

Periodical:

Materials Science Forum (Volumes 702-703)

Pages:

866-871

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.702-703.866

Citation:

Cite this paper

Online since:

December 2011

Authors:

Yu Dong Zhang, Shi Ying Wang, Claude Esling, Xiang Zhao, Liang Zuo

Keywords:

Burgers Vector, Dislocation, Orientation, TEM

Export:

RIS, BibTeX

Price:

Permissions CCC:

Request Permissions

Permissions PLS:

Request Permissions

Сopyright:

Citation:

References

[1] A. Morawiec: J. Appl. Cryst. Vol. 32 (1999), p.788.

Google Scholar

[2] A. Morawiec, J. Fundenberger, E. Bouzy, J. Lecomte: J. Appl. Cryst. Vol. 35 (2002), p.287.

Google Scholar

[3] R. A. Schwarzer: Ultramicroscopy Vol. 67 (1997), p.19.

Google Scholar

[4] J. Portillo, E. F. Rauch, S. Nicolopoulos, M. Gemmi, D. Bultreys: Materials Science Forum Vol. 644 (2010), p.1.

DOI: 10.4028/www.scientific.net/msf.644.1

Google Scholar

[5] V. Randle: Journal of Microscopy Vol. 230 (2007), p.406.

Google Scholar

[6] V. Randle: Scripta Mater. Vol. 44 (2001), p.2789.

Google Scholar

[7] Song Li, Yudong Zhang, Claude Esling, Jacques Muller, Jean-Sébastien Lecomte, Gaowu Qin, Xiang Zhao and Liang Zuo: J. Appl. Cryst. Vol. 42 ( 2009), p.519.

Google Scholar

[8] J. W. Edington, (1975). Practical Electron Microscopy in Materials Science, Monograph Three Interpretation of Transmission Electron Micrographs, Macmillan, London, (1975).

DOI: 10.1007/978-1-349-02658-6_1

Google Scholar

[9] H J Bunge, C Esling, J Muller. J Appl Cryst Vol. 13(1980), p.544.

Google Scholar