Calculation Methods to Determine Crystallographic Elements Based on Electron Diffraction Orientation Measurements by SEM/EBSD or TEM

Yu Dong Zhang; Zong Bin Li; Claude Esling; Xiang Zhao; Liang Zuo

doi:10.4028/www.scientific.net/MSF.706-709.2674

Paper Titles

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Texture Evolution in Nanocrystalline Fe Induced by Surface Mechanical Attrition Treatment
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Crystallographic Behaviors of Uni-Axial Deformed High Manganese Steels
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Effects of Magnetic Field Intensity on Microstructure and Orientation of Proeutectoid Ferrite in Fe-C Alloy
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Effect of Intercritical Annealing Time on Microstructure and Mechanical Behavior of Advanced Medium Mn Steels
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Two Novel Methods to Realize the Superplastic Forming of Ultrahigh Strength Steels
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HomeMaterials Science ForumMaterials Science Forum Vols. 706-709Calculation Methods to Determine Crystallographic...

Calculation Methods to Determine Crystallographic Elements Based on Electron Diffraction Orientation Measurements by SEM/EBSD or TEM

Abstract:

In the present work, we summarized two calculation methods to determine some specific crystallographic elements based on electron diffraction orientation measurements by SEM/EBSD or TEM. The first one is to determine the twin type and twinning elements of crystal twins based on the minimum shear criterion, using the experimentally determined twinning plane for Type I twin and compound twin or twinning direction for Type II twin as initial input. The method is valid for any crystal structure. The second one is one to determine the plane indices of the faceted interfaces where the orientation relationships (ORs) between the adjacent crystals are reproducible. The method requires one prepared sample surface instead of two perpendicular surfaces. These methods are expected to facilitate the related microstructural characterizations.

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Materials Science Forum (Volumes 706-709)

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2674-2679

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.706-709.2674

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Online since:

January 2012

Authors:

Yu Dong Zhang, Zong Bin Li, Claude Esling, Xiang Zhao, Liang Zuo

Keywords:

Twinning, Crystallographic Orientation, Electron Diffraction, Interface, Misorientation

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