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Boundary Migration during Recrystallization of Heavily Deformed Pure Nickel
Abstract:
The detailed microstructure in front of recrystallization boundaries and their migration during annealing were traced using ex-situ electron backscatter pattern maps of one and the same surface area taken after annealing. It is observed that many protrusions/detrusions form on the recrystallizing boundaries. During annealing, the recrystallization boundary segments migrate in a stop-go type of fashion, while protrusions and detrusions alternately form and disappear. The correlation between the protrusions/detrusions and the stop-go type of migration are briefly discussed.
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329-332
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Online since:
April 2012
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© 2012 Trans Tech Publications Ltd. All Rights Reserved
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