Boundary Migration during Recrystallization of Heavily Deformed Pure Nickel

Article Preview

Abstract:

The detailed microstructure in front of recrystallization boundaries and their migration during annealing were traced using ex-situ electron backscatter pattern maps of one and the same surface area taken after annealing. It is observed that many protrusions/detrusions form on the recrystallizing boundaries. During annealing, the recrystallization boundary segments migrate in a stop-go type of fashion, while protrusions and detrusions alternately form and disappear. The correlation between the protrusions/detrusions and the stop-go type of migration are briefly discussed.

You might also be interested in these eBooks

Info:

Periodical:

Materials Science Forum (Volumes 715-716)

Pages:

329-332

Citation:

Online since:

April 2012

Export:

Price:

Permissions CCC:

Permissions PLS:

Сopyright:

© 2012 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

[1] A.P. Sutton and R.W. Balluffi: Interfaces in Crystalline Materials (Oxford University Press, Oxford 1995).

Google Scholar

[2] D. Juul Jensen: Acta Metall. Mater. Vol. 43 (1995), p.4117.

Google Scholar

[3] S. Schmidt, S.F. Nielsen, C. Gundlach, L. Margulies, X. Huang and D. Juul Jensen: Science Vol. 305 (2004), p.229.

Google Scholar

[4] YB. Zhang, A. Godfrey, Q. Liu, W. Liu and D. Juul Jensen: Acta Mater. Vol. 57 (2009), p.2631.

Google Scholar

[5] P.A. Beck, P.R. Sperry and H. Hu: J Appl. Phys. Vol. 21 (1950), p.420.

Google Scholar

[6] M.A. Martorano, M.A. Fortes and A.F. Padilha: Acta Mater. Vol. 54 (2006), p.2769.

Google Scholar

[7] Y. Saito, H. Utsunomiya, N. Tsuji and T. Sakai: Acta Mater. Vol. 47 (1999), p.579.

Google Scholar

[8] Y.B. Zhang, A. Godfrey and D. Juul Jensen: submitted to Computers, Materials & Continua (2010).

Google Scholar