Box-Scan: A Novel 3DXRD Method for Studies of Recrystallization and Grain Growth

Abstract:

Within the last decade a number of x-ray diffraction methods have been presented for non-destructive 3D characterization of polycrystalline materials. 3DXRD [1] and Diffraction Contrast Tomography [2,3,4] are examples of such methods providing full spatial and crystallographic information of the individual grains. Both methods rely on specially designed high-resolution near-field detectors for acquire the shape of the illuminated grains, and therefore the spatial resolution is for both methods limited by the resolution of the detector, currently ~2 micrometers. Applying these methods using conventional far-field detectors provides information on centre of mass, crystallographic orientation and stress state of the individual grains [5], at the expense of high spatial resolution. However, far-field detectors have much higher efficiency than near-field detectors, and as such are suitable for dynamic studies requiring high temporal resolution and set-ups involving bulky sample environments (e.g. furnaces, stress-rigs etc.)

• Periodical: Materials Science Forum (Volumes 715-716)
• Pages: 518-520
• DOI: https://doi.org/10.4028/www.scientific.net/MSF.715-716.518
• Online since: April 2012
• Authors: Allan Lyckegaard, Henning Friis Poulsen, Wolfgang Ludwig, Richard W. Fonda, Erik M. Lauridsen
• Keywords: 6D Diffraction Space, Box-Scan, Non-Destructive, Nuclei, X-Ray Diffraction (XRD)

References

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