Diffraction Stress Analysis of Fiber Textured Ti Thin Films Undergoing hcp - fcc Phase Transformation

Abstract:

X-ray diffraction stress analysis by crystallite group method (CGM) has been employed in case of simultaneously strong and sharp fiber textured Ti thin films. These Ti films exhibit thickness dependent hcp-fcc phase transformation [Ref. 1]. Diffraction stress analysis has also been attempted by d-sin2 method for strongly textured face centered cubic (fcc) and hexagonal close packed (hcp) Ti phases. For hcp Ti phase, the results of stress analysis by CGM are compared with those obtained from d-sin2 method. It is found that the stress values in hcp Ti phases obtained from CGM considerably differ from the stresses obtained from d-sin2 method in some of the Ti films. Observed differences have been explained and possible sources of errors in d-sin2 method and CGM stress analysis have been discussed.

• Periodical: Materials Science Forum (Volumes 768-769)
• Pages: 257-263
• DOI: https://doi.org/10.4028/www.scientific.net/MSF.768-769.257
• Online since: September 2013
• Authors: Jay Chakraborty
• Keywords: Crystallite Group Method, 'd-sin²Ψ ' Method, Fiber Texture, Stress

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