In-Depth Distribution of Stresses Measured by Multireflection Grazing Incidence Diffraction

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Abstract:

The geometry based on the multireflection grazing incidence X-ray diffraction (called the MGIXD method) can be applied to measure residual stresses. Using this method, it is possible to perform a non-destructive analysis of the heterogeneous stresses for different and well defined volumes below the surface of the sample (range of several mm). As the result the average values of stresses weighted by absorption of X-ray radiation are measured. In this work the stress profile as a function of depth for mechanically polished Ti and Al samples were calculated from MGIXD data using inverse Laplace transform.

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143-147

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November 2013

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© 2014 Trans Tech Publications Ltd. All Rights Reserved

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