Effect of the Bias Voltage on the Structure, Mechanical, Electronic and Optical Properties of the Low Temperature ZnO Thin Films Deposited by Using Cathodic Vacuum Arc Deposition System on Plastic Substrates

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Abstract:

The un-doped zinc oxide (ZnO) films on the polyethylene terephthalate (PET) substrate at a low temperature (<75°C) by using cathode vacuum arc deposition (CVAD) system with different negative substrate bias voltage applied between 0 and -100 V. The material, mechanical, optical and electrical properties were investigated and discussed. The results show that all ZnO thin films have (002) preferred orientation, an average transmittance was over than 70 % in the visible region. Calculated band gap values are all around 3.2 eV with the different substrate bias voltages. The ZnO thin films with resistivities as low as 10-3 Ω*cm have been obtained by adjusting the substrate bias voltage on the plastic substrates.

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Materials Science Forum (Volumes 773-774)

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287-292

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November 2013

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© 2014 Trans Tech Publications Ltd. All Rights Reserved

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[1] M. Hadis, Zinc oxide: fundamentals, materials and device technology, Wiley, 2009.

Google Scholar

[2] T. Terasako, M. Yagi, M. Ishizaki, Y. Senda, H. Matsuura, S. Shirakata, Growth of zinc oxide films and nanowires by atmospheric-pressure chemical vapor deposition using zinc powder and water as source materials ,Surf. Coat. Technol. 201(2007) 8924.

DOI: 10.1016/j.surfcoat.2007.04.017

Google Scholar

[3] G.G. Rusu, A.P. Râmbu, V.E. Buta, M. Dobromir, D. Luca, M. Rusu, Structural and optical characterization of Al-doped ZnO films prepared by thermal oxidation of evaporated Zn/Al multilayered films, Mater. Chem. Phys. 123 (2010) 314.

DOI: 10.1016/j.matchemphys.2010.04.022

Google Scholar

[4] S. Ishibashi, Y Higuchi, Y. Ota, K. Nakamura, Low resistivity indium–tin oxide transparent conductive films. II. Effect of sputtering voltage on electrical property of films, J. Vac. Sci. Technol. A 8 (1990) 1403.

DOI: 10.1116/1.576890

Google Scholar

[5] B.L. Zhu, X.Z. Zhao, F.H. Su, G.H. Li, X.G. Wu, J. Wu, R. Wu, Low temperature annealing effects on the structure and optical properties of ZnO films grown by pulsed laser deposition, Vacuum 84 (2010) 1280.

DOI: 10.1016/j.vacuum.2010.01.059

Google Scholar

[6] D.R. Sahu, S.Y. Lin, J.L. Huang, Improved properties of Al-doped ZnO film by electron beam evaporation technique, Microelectron. J. 38 (2007) 245.

DOI: 10.1016/j.mejo.2006.11.005

Google Scholar

[7] E. Bacaksiz, S. Aksu, S. Yılmaz, M. Parlak, M. Altunbaş, Structural, optical and electrical properties of Al-doped ZnO microrods prepared by spray pyrolysis, Thin Solid Films 518 (2010) 4076.

DOI: 10.1016/j.tsf.2009.10.141

Google Scholar

[8] M. Fahoume, O. Maghfoul, M. Aggour, B. Hartiti, F. Chraïbi, A. Ennaoui, Growth and characterization of ZnO thin films prepared by electrodeposition technique, Sol. Energy Mater. Sol. Cells 90 (2006) 1437.

DOI: 10.1016/j.solmat.2005.10.010

Google Scholar

[9] R.Y. Yang, M.H. Weng, C.T. Pan, C.M. Hsiung, Low-temperature deposited ZnO thin films on the flexible substrate by cathodic vacuum arc technology, Appl. Surf. Sci. 257 (2011) 7119.

DOI: 10.1016/j.apsusc.2011.03.065

Google Scholar

[10] M.H. Weng, C.T. Pan, R.Y. Yang, C.M. Hsiung, Structure, optical and electrical properties of ZnO thin films on the flexible substrate by cathodic vacuum arc technology with different arc currents, Cer. Inter. 37 (2011) 3077.

DOI: 10.1016/j.ceramint.2011.05.043

Google Scholar

[11] H.W. Lee, S.P. Lau, Y.G. Wang, B.K. Tay, H.H. Hng, Internal stress and surface morphology of zinc oxide thin films deposited by filtered cathodic vacuum arc technique, Thin Solid Films 458 ( 2004)15.

DOI: 10.1016/j.tsf.2003.11.167

Google Scholar

[12] X.L. Xu, S.P. Lau, B.T. Tay, Structural and optical properties of ZnO thin films produced by filtered cathodic vacuum arc, Thin Solid Films 398-399 (2001) 244.

DOI: 10.1016/s0040-6090(01)01452-3

Google Scholar

[13] H. Changji, H. Zhenhui, Influence of Bias Voltage on the Structural Properties and Adhesive Performance of ZnO Thin Films Deposited by Cathodic Vacuum Arc Deposition on Polyimide Foil Substrates, Adv. Mater. Res. 160-162 (2011) 194.

DOI: 10.4028/www.scientific.net/amr.160-162.194

Google Scholar

[14] M. Ohring, The Material Science if Thin Films, Academic Press, 1992.

Google Scholar

[15] H.C. Ong, A.X.E. Zhu, G.T. Du, Dependence of the excitonic transition energies and mosaicity on residual strain in ZnO thin films, Appl. Phy. Let. 80 (2002) 941.

DOI: 10.1063/1.1448660

Google Scholar

[16] Y.G. Wang, S.P. Lau, H.W. Lee, S.F. Yu, B.K. Tay, X.H. Zhang, K.Y. Tse, H.H. Hng, Comprehensive study of ZnO films prepared by filtered cathodic vacuum arc at room temperature, J. Appl. Phys. 94 (2003) 1597.

DOI: 10.1063/1.1592007

Google Scholar

[17] Y.Y. Liu, Y.L. Zang, G.X. Wei, J.Li, X.L. Fan, C.F. Cheng, Stress and structural studies of ZnO thin films on polymer substrate under different RF powered conditions, Mater. Let. 63 (2009) 2597.

DOI: 10.1016/j.matlet.2009.08.027

Google Scholar

[18] L. Parfitt, M. Goldiner, J.W. Jones, G.S. Was, Residual stresses in amorphous alumina films synthesized by ion beam assisted deposition, J. Appl. Phys. 77 (1995) 3029.

DOI: 10.1063/1.358652

Google Scholar

[19] X.T. Hao, J. Ma , D.H. Zhang , Y.G. Yang , H.L. Ma, C.F. Cheng , X.D. Liu, Electrical characterization of thermally grown native oxide on gallium antimonide, Mater. Sci. and Eng. B 9 (2002) 50.

Google Scholar