Evaluation of Ductile Damage Progress of Aluminum Single Crystal with Prior Activity of Single Slip System under Tensile Loading by Using Synchrotron White X-Ray

Abstract:

A ductile damage progress of an aluminum single crystal with the prior activity of the single slip system under tensile loading was verified by a profile analysis using white X-ray obtained in BL28B2 beam line of SPring-8. In this study, the aluminum single crystal of the purity 6N was used as a specimen prepared in I-type geometry for tensile test. A notch was introduced into one side of the center of a parallel part of the specimen by the wire electric discharge machining. White X-ray beam, which has 50 μm in both height and width, was incident into the specimen on the Bragg angle θ of 3 degrees using energy dispersive X-ray diffraction technique. The specimen was deformed by elongation in the direction of 45°to [11 and [11 crystal orientations, respectively, and a diffraction profile of the white X-ray from Al220 plane was analyzed. In profile analysis, an instrumental function was defined in consideration both of a divergence by a slit and a response function peculiar to the energy dispersive method. The Gauss component of integral breadth related to non-uniform strain and the Cauchy component of integral breadth related to crystallite size were determined by eliminating the broadening by the instrumental function from the diffraction profile of white X-ray. As a result, the characteristics of ductile damage progress near the notch of the aluminum single crystal were inspected from the distribution of both non-uniform strain and dislocation density.

• Periodical: Materials Science Forum (Volume 777)
• Pages: 176-181
• DOI: https://doi.org/10.4028/www.scientific.net/MSF.777.176
• Online since: February 2014
• Authors: Junichi Shibano, Kentaro Kajiwara, T. Tsukamoto, H. Kawai, Setsuo Miura, Shuo Yuan Zhang, Takahisa Shobu, Michiaki Kobayashi
• Keywords: Aluminum Single Crystal, Crystal Orientation, Ductile Damage, White X-Ray

References

[1] G. K. Williamson and R. E. Smallman, Dislocation densities in some annealed and cold-worked metals from measurements on the X-ray debye-scherrer spectrum, Philos. Mag. 1 (1956) 34-46.

DOI: 10.1080/14786435608238074

[2] J. I. Langford, A rapid method for analyzing the breadths of diffraction and spectral lines using the Voigt function, J. Appl. Cryst. 11 (1978) 10-14.

DOI: 10.1107/s0021889878012601

[3] T. H. Keijser, J. I. Langford, E. J. Mittemeijer and A. B. P. Vogels, Use of the voigt function in a single-line method for the analysis of X-ray diffraction line broadening, J. Appl. Cryst. 15 (1982) 308-314.

DOI: 10.1107/s0021889882012035

[4] T. H. Keijser, E. J. Mittemeijer and H. C. F. Rozendaal, The determination of crystallite-size and lattice-strain parameters in conjunction with the profile-refinement method for the determination of crystal structures, J. Appl. Cryst. 16 (1983) 309-316.

DOI: 10.1107/s0021889883010493

[5] T. Ungar, S. Ott, P. G. Sanders, A. Borbely and J. R. Weertman, Dislocations, grain size and planar faults in nanostructured copper determined by high resolution X-ray diffraction and a new procedure of peak profile analysis, Acta. Mater. 46-10 (1998) 3693-3699.

DOI: 10.1016/s1359-6454(98)00001-9

[6] T. Ungar, Dislocation densities, arrangements and character from X-ray diffraction experiments, Materials Science and Engineering A309-310 (2001) 14-22.

DOI: 10.1016/s0921-5093(00)01685-3

[7] E. Schafler, M. Zehetbauer and T. Ungar, Measurement of screw and edge dislocation density by means of X-ray bragg profile analysis, Materials Science and Engineering A319-321 (2001) 220-223.

DOI: 10.1016/s0921-5093(01)00979-0

[8] J. Shibano, M. Kiso, K. Kajiwara, T. Shobu, S. Miura and M. Kobayashi, Study on Ductile Damage Progress of an Aluminum Single Crystal Using Synchrotron White X-Ray, Materials Science Forum, Vols.768-769(2014) 358-365.

DOI: 10.4028/www.scientific.net/msf.768-769.358