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HomeMaterials Science ForumMaterials Science Forum Vols. 783-786High Resolution Diffraction of a Superalloy during...

High Resolution Diffraction of a Superalloy during HT Processing and Mechanical Testing: Experiments and Modeling

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Abstract:

We present a computer inexpensive method to calculate the profile of the high resolution diffraction pattern of a single crystal superalloy. The displacement field is taken as the sum of the individual fields of cuboidal inclusions with uniform eigenstrains. Early simulations are compared to experimental data.

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THERMEC 2013

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Periodical:

Materials Science Forum (Volumes 783-786)

Pages:

2075-2080

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.783-786.2075

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Online since:

May 2014

Authors:

Alain Jacques*, Mohamed Biskri, Jean Philippe Chateau-Cornu, Thomas Schenk, Pierre Bastie

Keywords:

High Energy XRD, In Situ Diffraction, Stress, Superalloy

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© 2014 Trans Tech Publications Ltd. All Rights Reserved

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