Influence of PSI- and OMEGA-Tilting on X-Ray Stress Analysis
p.153
p.153
Non-Destructive Stress Measurement with Depth Resolution
p.159
p.159
Determination of the Misfit and Layer Thickness of Monocrystalline Epitaxial Layers by Means of High-Resolution X-Ray Diffraction
p.165
p.165
Preferred Orientation in Powder Diffraction
p.169
p.169
Texture Analysis of Multi-Phase Materials by Neutron Diffraction
p.179
p.179
Extinction in Texture Analysis
p.185
p.185
Method of Scanning of Reciprocal Space of Axial Textures and its Applications to Structural Investigations
p.191
p.191
On the Use of Rietveld Refinements for Structural Studies
p.197
p.197
The Two-Step-Method and its Applications in Crystallographic Problems
p.207
p.207
Texture Analysis of Multi-Phase Materials by Neutron Diffraction
Abstract:
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Periodical:
Materials Science Forum (Volumes 79-82)
Pages:
179-184
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Online since:
January 1991
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© 1991 Trans Tech Publications Ltd. All Rights Reserved
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