Determination of the Misfit and Layer Thickness of Monocrystalline Epitaxial Layers by Means of High-Resolution X-Ray Diffraction

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Periodical:

Materials Science Forum (Volumes 79-82)

Edited by:

R. Delhez and E.J. Mittemeijer

Pages:

165-168

DOI:

10.4028/www.scientific.net/MSF.79-82.165

Citation:

H.-G. Brühl and H. Rhan, "Determination of the Misfit and Layer Thickness of Monocrystalline Epitaxial Layers by Means of High-Resolution X-Ray Diffraction", Materials Science Forum, Vols. 79-82, pp. 165-168, 1991

Online since:

January 1991

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