The Method of Synthesizing the Function of the Diffraction Maximum Shape. The Possibility of Applying it for Structural Refinement
p.113
p.113
A Correction for Truncation of Powder Diffraction Line Profiles
p.119
p.119
Comparison of Single- and Multiple-Peak Methods for the Determination of Crystallite Size and Lattice Strain using Pseudo-Voigt Functions
p.125
p.125
X-Ray Powder Diffraction Data Reduction by Integrating the Wilson and the Warren-Averbach Theories
p.131
p.131
Simulation of Diffraction Patterns from Small Bimetallic Crystals with Concentration Gradient
p.139
p.139
X-Ray Stress Analysis
p.143
p.143
Influence of PSI- and OMEGA-Tilting on X-Ray Stress Analysis
p.153
p.153
Non-Destructive Stress Measurement with Depth Resolution
p.159
p.159
Determination of the Misfit and Layer Thickness of Monocrystalline Epitaxial Layers by Means of High-Resolution X-Ray Diffraction
p.165
p.165
Simulation of Diffraction Patterns from Small Bimetallic Crystals with Concentration Gradient
Abstract:
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Periodical:
Materials Science Forum (Volumes 79-82)
Pages:
139-142
Citation:
Online since:
January 1991
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© 1991 Trans Tech Publications Ltd. All Rights Reserved
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