A Method for Data Reduction and Optimal Experimental Design in XPD
p.107
p.107
The Method of Synthesizing the Function of the Diffraction Maximum Shape. The Possibility of Applying it for Structural Refinement
p.113
p.113
A Correction for Truncation of Powder Diffraction Line Profiles
p.119
p.119
Comparison of Single- and Multiple-Peak Methods for the Determination of Crystallite Size and Lattice Strain using Pseudo-Voigt Functions
p.125
p.125
X-Ray Powder Diffraction Data Reduction by Integrating the Wilson and the Warren-Averbach Theories
p.131
p.131
Simulation of Diffraction Patterns from Small Bimetallic Crystals with Concentration Gradient
p.139
p.139
X-Ray Stress Analysis
p.143
p.143
Influence of PSI- and OMEGA-Tilting on X-Ray Stress Analysis
p.153
p.153
Non-Destructive Stress Measurement with Depth Resolution
p.159
p.159
X-Ray Powder Diffraction Data Reduction by Integrating the Wilson and the Warren-Averbach Theories
Abstract:
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Periodical:
Materials Science Forum (Volumes 79-82)
Pages:
131-138
Citation:
Online since:
January 1991
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© 1991 Trans Tech Publications Ltd. All Rights Reserved
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