Paper Titles

A Correction for Truncation of Powder Diffraction Line Profiles
p.119

Comparison of Single- and Multiple-Peak Methods for the Determination of Crystallite Size and Lattice Strain using Pseudo-Voigt Functions
p.125

X-Ray Powder Diffraction Data Reduction by Integrating the Wilson and the Warren-Averbach Theories
p.131

Simulation of Diffraction Patterns from Small Bimetallic Crystals with Concentration Gradient
p.139

X-Ray Stress Analysis
p.143

Influence of PSI- and OMEGA-Tilting on X-Ray Stress Analysis
p.153

Non-Destructive Stress Measurement with Depth Resolution
p.159

Determination of the Misfit and Layer Thickness of Monocrystalline Epitaxial Layers by Means of High-Resolution X-Ray Diffraction
p.165

Preferred Orientation in Powder Diffraction
p.169

HomeMaterials Science ForumMaterials Science Forum Vols. 79-82X-Ray Stress Analysis

X-Ray Stress Analysis

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Periodical:

Materials Science Forum (Volumes 79-82)

Pages:

143-152

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.79-82.143

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Online since:

January 1991

Authors:

Jean Michel Sprauel, L. Castex

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© 1991 Trans Tech Publications Ltd. All Rights Reserved

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