A High-Pressure X-Ray Diffraction Study of UAs0.6Se0.4

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Periodical:

Materials Science Forum (Volumes 79-82)

Edited by:

R. Delhez and E.J. Mittemeijer

Pages:

643-646

DOI:

10.4028/www.scientific.net/MSF.79-82.643

Citation:

L. Gerward et al., "A High-Pressure X-Ray Diffraction Study of UAs0.6Se0.4", Materials Science Forum, Vols. 79-82, pp. 643-646, 1991

Online since:

January 1991

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$35.00

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