Passivation of Shallow Acceptors in Si and GaAs by Annealing in H2
p.111
p.111
Interstitial H and {H,B}, {H,C}and {H,Si} Pairs in Si and Ge
p.119
p.119
Spectroscopy on Transition-Metal Defects in Silicon
p.125
p.125
Transition-Metal Acceptor Pairs in Silicon
p.137
p.137
Theoretical Interpretation of EPR Measurements on the Iron-Shallow Acceptor Pairs in Silicon
p.143
p.143
Magneto-Optical Properties of Fe-Al Pairs in Silicon and the Discovery of a New Trigonal (Fei-Als)0 Pair
p.149
p.149
<100> and<111> Configurations of Iron-Acceptor Pairs in Silicon Related to Stable and Metastable States
p.155
p.155
Copper Related Defect Reactions in P-Type Silicon
p.161
p.161
Interaction of a Copper-Induced Defect with Shallow Acceptors and Deep Centers in Silicon
p.167
p.167
Theoretical Interpretation of EPR Measurements on the Iron-Shallow Acceptor Pairs in Silicon
Abstract:
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Periodical:
Materials Science Forum (Volumes 83-87)
Pages:
143-148
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Online since:
January 1992
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© 1992 Trans Tech Publications Ltd. All Rights Reserved
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