Engineering Research
Advanced Engineering Forum
Applied Mechanics and Materials
Engineering Chemistry
Engineering Innovations
Journal of Biomimetics, Biomaterials and Biomedical Engineering
International Journal of Engineering Research in Africa
Materials Science
Advanced Materials Research
Defect and Diffusion Forum
Diffusion Foundations and Materials Applications
Journal of Metastable and Nanocrystalline Materials
Journal of Nano Research
Key Engineering Materials
Materials Science Forum
Nano Hybrids and Composites
Solid State Phenomena
Engineering Series
Advances in Science and Technology
Construction Technologies and Architecture
Engineering Headway
Defects in Semiconductors 16
Description:
Part 1. 1. Hydrogen in Elemental Hosts . 2. Transition Metal Impurities in Elemental Hosts . 3. Impurities in Elemental Hosts . 4. Irradiation Defects in Elemental Hosts . 5. Oxygen in GaAs, Si and Ge . 6. Theory . Part 2 . 7. Hydrogen in Compound Semiconductors . 8. Rare Earth Impurities in Silicon and Compound Semiconductors . 9. Transition Metal Impurities in Compound Semiconductors . 10. Donors in Compound Semiconductors . 11. EL2 And Anti-Site Related Defects . 12. Other Defects in III-V Semiconductors . 13. Growth Defects . Part 3 . 14. New Techniques . 15. Defects in SiC and Diamond . 16. Defects in II-VI Semiconductors . 17. Hetero-Epitaxy and Strained Layers . 18. Dislocations . 19. Superlattices . 20. Defects at Surfaces and Interfaces and in Low-Dimensional Structures . 21. Processing-Induced Defects . 22. Effects of Defects on Devices .
Purchase this book:
eBook
978-3-0357-0460-0
$198.00 *
Print
978-0-87849-628-0
$704.00
not available
eBook+Print
978-0-87849-628-0
$721.60 *
not available
* 1-User Access (Single User-Price). For Multi-User-Price please fill a contact form
Info:
eBook:
ToC:
Editors:
Gordon Davies, G.G. DeLeo and M. Stavola
THEMA:
TGM
BISAC:
TEC021000
Keywords:
Details:
Proceedings of the 16th International Conference Defects in Semiconductors (ICDS-16), Lehigh University, USA, July 1991
Pages:
1634
Year:
1992
ISBN-13:
9780878496280
ISBN-13 (CD):
9783038597759
ISBN-13 (eBook):
9783035704600
Permissions CCC:
Permissions PLS:
Share: