Paper Titles

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Gettering of Copper and Iron to Extended Surface Defects in Silicon
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Shallow Excited States of the 1014 meV Cu Related Optical Center in Silicon
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Electronic Nature of Neutral Zinc in Silicon: FTIR-Absorption, Uniaxial Stress Measurements
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Diffusion of Gold in Amorphous Silicon
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Vibronic Interaction of a Gold-Related Center in Silicon
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The Gold Center in Silicon
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HomeMaterials Science ForumMaterials Science Forum Vols. 83-87Electronic Nature of Neutral Zinc in Silicon:...

Electronic Nature of Neutral Zinc in Silicon: FTIR-Absorption, Uniaxial Stress Measurements

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Defects in Semiconductors 16

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Periodical:

Materials Science Forum (Volumes 83-87)

Pages:

197-202

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.83-87.197

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Online since:

January 1992

Authors:

B. Kaufmann, Achim Dörnen, M. Lang, Gerhard Pensl, D. Grünebaum, Nicolaas Stolwijk

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© 1992 Trans Tech Publications Ltd. All Rights Reserved

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