Structural and Magnetic Investigation of Cu, Co Substituted NiFe₂O₄ Thin Films by Scanning Probe Microscopy (AFM, MFM)

Abstract:

In the present study we prepared NiFe₂O₄, Ni_0.95Cu_0.05Fe₂O₄ and Ni_0.94Cu_0.05Co_0.01 Fe₂O₄ thin films by metallo-organic decomposition method (MOD) using spin coating technique. The samples were characterized by XRD. XRD patterns of thin films confirmed the formation of cubic spinel structure without any secondary phase. For microstructural analysis we characterized samples by Scanning Probe Microscope (SPM). From Atomic force microscopy (AFM), we analyzed surface morphology, calculated grain size, roughness and porosity. It has been found that grain size and roughness affected by Cu, Co substitution. After this we carried out magnetic force microscopy (MFM) on the samples. Effect of substitution on magnetic grains was observed from MFM.

• Periodical: Materials Science Forum (Volumes 830-831)
• Pages: 589-591
• DOI: https://doi.org/10.4028/www.scientific.net/MSF.830-831.589
• Online since: September 2015
• Authors: Hakikat Sharma*, N.S. Negi
• Keywords: AFM, MFM, MOD, Roughness, XRD

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