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HomeMaterials Science ForumMaterials Science Forum Vols. 94-96HVEM In Situ Investigation of Stress-Induced Grain...

HVEM In Situ Investigation of Stress-Induced Grain Growth during Thermal Annealing of Thin Al-Alloy Films on a Si/SiO₂ Substrate

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Grain Growth in Polycrystalline Materials I

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Periodical:

Materials Science Forum (Volumes 94-96)

Pages:

551-556

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.94-96.551

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Online since:

January 1992

Authors:

D. Katzer, D. Gerth, R. Riesenberg

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© 1992 Trans Tech Publications Ltd. All Rights Reserved

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