The Use of X-Ray Diffraction Peaks Profile Analysis to Define the Structural Condition of Elastically Stressed 09G2S Steel

Abstract:

By using X-ray diffractometry, it was determined how short-term stresses, being within the limits of the offset yield strength σ_s, influence changes in the diffraction line profile characteristics resulting from static tension in plate specimens of 09G2S (09Г2С) structural steel. Microstructural changes in the surface of 09G2S steel specimens considered in this work were studied at different levels of elastic stress. The special aspects of changes in the diffraction line profile characteristics are presented and discussed, specifically, a broadening of the profile maximum half-width (B), as a response to the external mechanical impact on the surface layers.

• Periodical: Materials Science Forum (Volume 992)
• Pages: 981-986
• DOI: https://doi.org/10.4028/www.scientific.net/MSF.992.981
• Online since: May 2020
• Authors: V.P. Gulyaev*, P.P. Petrov, Ksenia V. Stepanova
• Keywords: Elastic Stress, Long-Term Static Loading, Mechanical Behavior, Structural Steel, X-Ray Structure Analysis, Yield Strength

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