Combined Analysis of Bi2223 Superconducting Bulk Materials

E. Guilmeau; Daniel Chateigner; J. Noudem; B. Ouladdiaf

doi:10.4028/www.scientific.net/SSP.105.385

Paper Titles

Texture Evolution in Commercially Pure Al during Equal Channel Angular Extrusion (ECAE) as a Function of Processing Routes
p.357

Strain Localization Observed during Shearing of Some Aluminium Alloys and Texture Softening Predicted by FC Taylor and Advanced Lamel Model
p.363

Simulating the Temper Rolling of Galvanized Steel
p.371

Quantifying Domain Textures in Lead Zirconate Titanate Using 022:202 and 220 Diffraction Peaks
p.379

Combined Analysis of Bi2223 Superconducting Bulk Materials
p.385

Effects of Dielectric Roughness on Texture of Both PVD Seed Layers and EP Copper
p.391

Texture Transition in Ag-Pd Alloy Substrate for Superconducting Tapes
p.397

Micro-Diffraction Studies of the Evolution of Textures in CVD-Grown Diamond Films
p.403

Temperature Dependence of the Texture of Sm-Co Thin Films
p.409

HomeSolid State PhenomenaSolid State Phenomena Vol. 105Combined Analysis of Bi2223 Superconducting Bulk...

Combined Analysis of Bi2223 Superconducting Bulk Materials

Abstract:

Orientation distributions of polyphased (Bi,Pb)2Sr2Ca2Cu3O10+d superconducting textured materials are determined from neutron diffraction analysis. The quantitative texture analysis of neutron data was accomplished by using the combined Rietveld-WIMV-Popa algorithms, implemented in the program package Materials Analysis Using Diffraction (MAUD). Curved position-sensitive detector and 4-circle diffractometry allow the whole diffraction pattern treatment. Transport critical current densities, measured on different samples, are strongly dependent of the calculated texture strengths, crystallite sizes and phase ratios. The results prove the interest of the combined approach for a quantitative texture analysis of complex materials. Texture to anisotropic physical properties relationship is discussed.

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Periodical:

Solid State Phenomena (Volume 105)

Pages:

385-390

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.105.385

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Online since:

July 2005

Authors:

E. Guilmeau, Daniel Chateigner, J. Noudem, B. Ouladdiaf

Keywords:

Bi2223, Combined Analysis, Superconductor, Texture

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