Thickness Measurement of Thin Textured Films by a Novel X-Ray Diffraction Method Accounting for Secondary Extinction

I. Tomov; S. Vassilev

doi:10.4028/www.scientific.net/SSP.130.43

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Application of Energy Dispersive X-Ray Diffraction for the Efficient Investigation of Internal Stresses in Thin Films
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Thickness Measurement of Thin Textured Films by a Novel X-Ray Diffraction Method Accounting for Secondary Extinction
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HomeSolid State PhenomenaSolid State Phenomena Vol. 130Thickness Measurement of Thin Textured Films by a...

Thickness Measurement of Thin Textured Films by a Novel X-Ray Diffraction Method Accounting for Secondary Extinction

Abstract:

Accounting for secondary extinction (SE) of the intensities measured from a textured film by means of conventional X-ray diffractometer, a new X-ray diffraction method is described for determination of film thickness. Physically, the problem is restricted to using a reflection pair corresponding to the main component of the texture. As model sample a vacuum-deposited silver thin film is used.

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Periodical:

Solid State Phenomena (Volume 130)

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43-46

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https://doi.org/10.4028/www.scientific.net/SSP.130.43

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Online since:

December 2007

Authors:

I. Tomov, S. Vassilev

Keywords:

Extinction, Film, Measurement, Texture, Thickness, X-Ray Diffraction (XRD)

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References

[1] H. Friedman and L.S. Birks: Rev. Sci. Instruments Vol. 17 (1946), p.99.

Google Scholar

[2] O.K. Korelov, A.N. Longvinov, V.G. Skryabin and V.D. Yushin: Instrum. Exp. Tech. (USSR) Vol. 27 (1984), p.468.

Google Scholar

[3] D.E. Anderson and W.J. Thomson: J. Appl. Cryst. Vol. 22 (1989) p.150.

Google Scholar

[4] J. Lhotka, R. Kuzel, G. Cappuccio and V. Valvoda: Mater. Sci. Forum Vol. 443-444 (2004), p.115.

Google Scholar

[5] B. Coulman, H. Chen and L.E. Rehn: J. Appl. Physics Vol. 57 (1985) p.643.

Google Scholar

[6] C. Brandt and G. van der Vliet: Adv. X-Ray Analysis Vol 29 (1986), p.203.

Google Scholar

[7] C.G. Darwin: Phil. Mag. Vol. 43 (1922), p.800.

Google Scholar

[8] W.H. Zachariasen: Acta Cryst. Vol. 16 (1963), p.1139.

Google Scholar

[9] R.W. James: The Optical Principles of the Diffraction of X-rays (G. Bell & Sons, Ltd. 1965).

Google Scholar

[10] T.M. Sabine: International Tables for Crystallography (Kluwer, Dordrecht, Vol. C, 1992).

Google Scholar

[11] I. Tomov: Arch. Mettal. & Materials Vol. 50 (2005) 147-157.

Google Scholar

[12] H. J. Bunge: Textures and Microstructures Vol. 29, 1-26 (1997).

Google Scholar

[13] I. Tomov: submitted to the Proceedings from EPDIC-10 Conference Acknowledgments. The author thanks Mrs. T. Bojinova for her technical assistance. This work was partially supported by the National Science Fund at the Ministry of Education and Science of Bulgaria (Contract No. X-1507/2005).

Google Scholar