Method of Dynamic Parameters Measurement of High-Speed DAC's

Abstract:

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Developed sampling device and algorithm of digital signal processing for automated measurement of settling times of fast DACs is represented. The new sampling device with numerically controlled oscillators allows realizing of the different types of the time scale transformation. Using of sigma-delta ADC and FIFO memory allows significant simplification of the device. The equations of time scale transformation ratio and sampling step are presented. Results of the research of developed digital signal processing algorithm are submitted.

Info:

Periodical:

Solid State Phenomena (Volume 144)

Edited by:

Inga Skiedraite and Jolanta Baskutiene

Pages:

157-162

DOI:

10.4028/www.scientific.net/SSP.144.157

Citation:

V. Kvedaras et al., "Method of Dynamic Parameters Measurement of High-Speed DAC's", Solid State Phenomena, Vol. 144, pp. 157-162, 2009

Online since:

September 2008

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Price:

$35.00

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