Magneto-Optical Investigation of Thin-Film Magnetic Systems
Results on the investigation of magnetic and magneto-optical properties of nanocrystalline Fe/Zr and Fe/Zr, Mo/Fe thin-film systems are presented. The examined samples were prepared by DC magnetron sputtering technique. The structural investigations of the samples were performed by X-ray diffraction analysis. The hysteresis loops and spectral dependencies of the transverse Kerr effect were measured employing the magneto-optical magnetometer and the magneto-optical spectrometer, respectively. The influence of the Zr and Mo layer thickness on the magnetic and magneto-optical properties of the examined samples was observed.
E. E. Shalygina et al., "Magneto-Optical Investigation of Thin-Film Magnetic Systems", Solid State Phenomena, Vols. 152-153, pp. 253-256, 2009