Magneto-Optical Investigation of Thin-Film Magnetic Systems

Abstract:

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Results on the investigation of magnetic and magneto-optical properties of nanocrystalline Fe/Zr and Fe/Zr, Mo/Fe thin-film systems are presented. The examined samples were prepared by DC magnetron sputtering technique. The structural investigations of the samples were performed by X-ray diffraction analysis. The hysteresis loops and spectral dependencies of the transverse Kerr effect were measured employing the magneto-optical magnetometer and the magneto-optical spectrometer, respectively. The influence of the Zr and Mo layer thickness on the magnetic and magneto-optical properties of the examined samples was observed.

Info:

Periodical:

Solid State Phenomena (Volumes 152-153)

Edited by:

N. Perov

Pages:

253-256

DOI:

10.4028/www.scientific.net/SSP.152-153.253

Citation:

E. E. Shalygina et al., "Magneto-Optical Investigation of Thin-Film Magnetic Systems", Solid State Phenomena, Vols. 152-153, pp. 253-256, 2009

Online since:

April 2009

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Price:

$35.00

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