ESD Affected GMR Head Detection by Using Machine Model: Wavelet Transform Technique Approach

N. Suwannata; D. Sompongse; P. Rakpongsiri; Apirat Siritaratiwat

doi:10.4028/www.scientific.net/SSP.152-153.443

Paper Titles

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Heating in an Alternating Magnetic Field due to Non-Equilibrium Magnetization
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Dependence of Flex on Suspension Capacitance on Human-Body-Model-Electrostatic-Discharge Affected TMR Head
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ESD Affected GMR Head Detection by Using Machine Model: Wavelet Transform Technique Approach
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An EMI Immunity Study of TMR Heads in Quasi-Static Tester due to the Direction of Sweeping Frequency
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Superconducting Gap of Fe-Intercalated TiSe₂ Observed Using Ultrahigh-Resolution Photoemission Spectroscopy
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Proximity Effect as a Probe of Electronic Correlations and Exchange Field in Dirty Ferromagnet/Superconductor Nanostructures
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Inhomogeneous Current Distribution in a Bimetal Ferromagnet/Superconductor Film in a Longitudinal Magnetic Field
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ESD Affected GMR Head Detection by Using Machine Model: Wavelet Transform Technique Approach

Abstract:

This report proposes the wavelet transform technique using the 4th Daubechies order to detect glitches on a magnetic recording head signal in the time-domain. It is found that the glitch occurs when the electrostatic discharged (ESD) level of the machine model (MM) on giant magnetoresistive (GMR) heads is in the range of 6-9 V. The electrical test parameter and scanning electron microscope (SEM) photograph of recording heads shows no change in reader sensor. However, the parameter and SEM results clearly show the visible GMR damage when the MM-ESD voltage (VESD) is 10 V. The glitch in magnetic response signal of the GMR head occurs when the VESD is increased. Therefore, the wavelet transform technique can be a novel instrument to forecast the GMR degradation due to the MM-ESD effect.