The Mechanism of Defects Formation in Silicon Substrates

A. Bogorosh; S. Voronov; N. Višniakov; D. Ščekaturovienė; Algimantas Bubulis

doi:10.4028/www.scientific.net/SSP.165.7

Paper Titles

Preface

Solar Control Glass
p.1

The Mechanism of Defects Formation in Silicon Substrates
p.7

The Simulation Spreading Process of Steel Tubes Hollow
p.13

Effect of the Unit Pressure on the Selection Parameters of Intermetallic Coatings NiAl and Ni₃Al after Plastic Working
p.19

Assessments of Shrinkage Degree in Bioceramic Sinters HA+ZrO₂
p.25

Structure and Properties of Bioceramics Layers Used for Implant Coatings
p.31

Stress Corrosion Cracking of 5083 and 7020 Aluminium Alloys Jointed by Friction Stir Welding
p.37

Tensor Interpolation of Tribological Wear in Ionitriding of 316L Steel
p.43

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The Mechanism of Defects Formation in Silicon Substrates

Abstract:

Components of navigating devices can be affected by acoustic emission and vibration. Therefore prototype samples and electronic components must be tested in such conditions. Heterostructures, which destructed under the action of external physical factors and kinetics of formations of porous defects in silicon substrates, were analyzed.

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Periodical:

Solid State Phenomena (Volume 165)

Pages:

7-12

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.165.7

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Online since:

June 2010

Authors:

A. Bogorosh, S. Voronov, N. Višniakov, D. Ščekaturovienė, Algimantas Bubulis

Keywords:

Defect Formation, Heterostructures on Silicon Substrate, Nanocrack, Navigating Electronic Device

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References

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