Growth and Characterization of Well-Aligned RuO2/R-TiO2 Heteronanostructures on Sapphire (100) Substrates by Reactive Magnetron Sputtering

Abstract:

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We report the growth of well-aligned RuO2/R-TiO2 heteronanostructures on sapphire (100) substrates by reactive magnetron sputtering using Ti and Ru metal targets under different conditions. The surface morphology and structural properties of the as-deposited heteronanostructures were characterized using field-emission scanning electron microscopy (FESEM), X-ray diffraction (XRD), transmission electron microscopy (TEM) and selected-area electron diffractometry (SAED). The FESEM micrographs and XRD patterns indicated the growth of vertically aligned RuO2(001) nanotubes and twinned V-shaped RuO2(101) nanowedges (NWs) on top of R-TiO2 nanorods under different sputtering pressures. TEM and SAED characterizations of the V-shaped RuO2 NWs showed that the NWs are crystalline RuO2 with twin planes of (101) and twin direction of [ 01] at the V-junction.

Info:

Periodical:

Solid State Phenomena (Volume 170)

Edited by:

J.-L. Bobet, B. Chevalier and D. Fruchart

Pages:

78-82

DOI:

10.4028/www.scientific.net/SSP.170.78

Citation:

H. P. Hsu et al., "Growth and Characterization of Well-Aligned RuO2/R-TiO2 Heteronanostructures on Sapphire (100) Substrates by Reactive Magnetron Sputtering", Solid State Phenomena, Vol. 170, pp. 78-82, 2011

Online since:

April 2011

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$35.00

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