Features of Magnetic Properties and FMR of CoFeZr/Si Layered Nanosystems due to their Inner Structure

Ju. Chekrygina; A. Devizenko; Y. Kalinin; E. Lebedeva; I. Shipkova; A.V. Sitnikov; N. Syr’ev; S. Vyzulin

doi:10.4028/www.scientific.net/SSP.190.605

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Waveguide Properties of Planar Structures Based on the Left-Handed Media
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Features of Magnetic Properties and FMR of CoFeZr/Si Layered Nanosystems due to their Inner Structure
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Features of Magnetic Properties and FMR of CoFeZr/Si Layered Nanosystems due to their Inner Structure

Abstract:

Static magnetic properties, ferromagnetic resonance (FMR) and glancing angle X-ray diffraction spectra (GAXRD) of CoFeZr (tm)/Si (tSi) in multilayer nanosystems were investigated for two groups of the samples characterized by t_m = 2 3 nm, t_Si = 0.5 5 nm and by t_m = 7 12 nm, t_Si = 5 13 nm. A computer simulation of GAXRD spectra of multilayer interference structures has been performed taking into account the possibility of silicides formation at metal-Si interfaces. Matter of discussion is the layer and interlayer thickness below which a resonance response corresponds to that of an effective medium rather than of an individual magnetic layer.

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Periodical:

Solid State Phenomena (Volume 190)

Pages:

605-608

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.190.605

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Online since:

June 2012

Authors:

Ju. Chekrygina, A. Devizenko, Y. Kalinin, E. Lebedeva, I. Shipkova, A.V. Sitnikov, N. Syr’ev, S. Vyzulin

Keywords:

Ferromagnetic Resonance (FMR), Magnetic Property, Multilayer Nanostructure, X-Ray Diffraction (XRD)

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References

[1] J.M. Poate , K.N. Tu, J.W. Meyer, Thin films - interdiffusion and reactions, John Wiley & Sons, New York - Chichester - Brisbane - Toronto, (1978).

Google Scholar

[2] S. P. Murarka, Silicides for VLSI Applications, Academic Press, New York – London – Paris – San Diego – San Francisko – Sao Paulo – Sydney – Tokio – Toronto, (1983).

DOI: 10.1002/nadc.19840320113

Google Scholar

[3] Ch. Kittel, Introduction in Solid State Physics, fourth ed., Wiley, (1973).

Google Scholar

[4] A.V. Vinogradov, X-Ray mirror optics (in Russian), Mashinostroenie, Leningrad, (1989).

Google Scholar