Fractal Analysis of AFM Data Characterizing Strongly Isotropic and Anisotropic Surface Topography

Miroslaw Bramowicz; Slawomir Kulesza; Tomasz Lipiński; Pawel Szabracki; Pawel Piatkowski

doi:10.4028/www.scientific.net/SSP.203-204.86

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HomeSolid State PhenomenaSolid State Phenomena Vols. 203-204Fractal Analysis of AFM Data Characterizing...

Fractal Analysis of AFM Data Characterizing Strongly Isotropic and Anisotropic Surface Topography

Abstract:

This study discusses changes in the value of fractal parameters determined based on functions of structure S(t), generated in different directions of anisotropy of the examined surfaces. The analyzed material consisted of AFM calibration standards TGT1, PG and TGZ1 which were used as models of strongly isotropic and anisotropic surfaces. The topography of the examined surfaces was imaged by atomic force microscopy. The obtained results indicate that all surfaces can be described mathematically to identify fractal parameters in any anisotropic direction.

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Periodical:

Solid State Phenomena (Volumes 203-204)

Pages:

86-89

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.203-204.86

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Online since:

June 2013

Authors:

Miroslaw Bramowicz, Slawomir Kulesza, Tomasz Lipiński, Pawel Szabracki, Pawel Piatkowski

Keywords:

AFM, Fractal Analysis, SPM, Structure Function, Surface Analysis, Surface Topography

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