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Ionic Transport Properties of Yttria-Doped Zirconia
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Direct Determination of Grain Boundary Diffusion Coefficients and Segregation Factors of Se and Au Tracers in Cu - Polycrystals from Diffusion Measurements in Type-C and Type-B Regimes
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Chemical Diffusion in Nb-Doped TiO₂
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Influence of Ca on the Transport Properties and on the Oxydo-Reduction Kinetics of CoO
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The Influence of Diffusion-Related Mechanisms in Limiting Oxide-Scale Failure
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Two-Dimensional Simulation of Unstable Roughening of the Oxide-Metal Interface during Selective Oxidation of Binary Alloys
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HomeSolid State PhenomenaSolid State Phenomena Vol. 41Direct Determination of Grain Boundary Diffusion...

Direct Determination of Grain Boundary Diffusion Coefficients and Segregation Factors of Se and Au Tracers in Cu - Polycrystals from Diffusion Measurements in Type-C and Type-B Regimes

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Periodical:

Solid State Phenomena (Volume 41)

Pages:

113-120

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.41.113

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Online since:

February 1995

Authors:

T. Surholt, Yuri M. Mishin, Christian Herzig

Keywords:

Copper Polycrystal, Grain Boundary Diffusion, Grain Boundary Segregation, Radiotracer Diffusion

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© 1995 Trans Tech Publications Ltd. All Rights Reserved

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