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HomeSolid State PhenomenaSolid State Phenomena Vols. 51-52Microstructure and Electrical Properties of some...

Microstructure and Electrical Properties of some Multicrystalline Silicon Billets Continuously Cast in a Cold Crucible

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Polycrystalline Semiconductors IV

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Periodical:

Solid State Phenomena (Volumes 51-52)

Pages:

473-478

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.51-52.473

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Online since:

May 1996

Authors:

Isabelle Périchaud, Gilles Dour, B. Pillin, Francis Durand, D. Sarti, Santo Martinuzzi

Keywords:

Carrier Diffusion Length, Cold Crucible, Grain Boundary, Intragrain Extended Defects, LBIC Mapping, Minority, Precipitation

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© 1996 Trans Tech Publications Ltd. All Rights Reserved

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